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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2019 Volume 53, Issue 7, Pages 1010–1016 (Mi phts5470)

This article is cited in 2 papers

Manufacturing, processing, testing of materials and structures

Comprehensive study of the nanoporous si layer influence on atomic and electron structure and optical properties of A$^{\mathrm{III}}$N/por-Si heterostructures grown by plasma assisted molecular beam epitaxy

P. V. Seredinab, A. S. Len'shina, D. S. Zolotukhina, D. L. Goloshchapova, A. M. Mizerovc, I. N. Arsent'evd, A. N. Beltyukove

a Voronezh State University
b Ural Federal University named after the First President of Russia B. N. Yeltsin, Ekaterinburg
c Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
d Ioffe Institute, St. Petersburg
e Udmurt Federal Research Center of the Ural Branch of the Russian Academy of Sciences, Izhevsk

Abstract: The influence of using a buffer sublayer of nanoporous por-Si on the morphological, physical, and structural properties of nanocolumnar In$_x$Ga$_{1-x}$N structures fabricated by plasma-activated molecular-beam epitaxy on single-crystal Si(111) substrates is shown. Using a set of structural-spectroscopic analytical methods, the electronic structure of the grown heterostructures, morphology, and optical properties are investigated, and the interrelations between them are established. It is shown that the use of a por-Si sublayer makes it possible to attain a more uniform distribution of diameters of In$_x$Ga$_{1-x}$N nanocolumns and to increase the photoluminescence intensity of the latter.

Received: 12.02.2019
Revised: 26.02.2019
Accepted: 26.02.2019

DOI: 10.21883/FTP.2019.07.47882.9084


 English version:
Semiconductors, 2019, 53:7, 993–999

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