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Fizika i Tekhnika Poluprovodnikov, 2019 Volume 53, Issue 4, Pages 462–465 (Mi phts5533)

Surface, interfaces, thin films

Effect of a second-order phase transition on the electrical conductivity of metal/semiconductor structures

I. R. Nabiullina, R. M. Gadieva, A. N. Lachinovb

a Bashkir State Pedagogical University n. a. M. Akmulla, Ufa
b Institute of Molecule and Crystal Physics, Ufa Federal Research Centre, Russian Academy of Sciences

Abstract: The properties of the Cr–$p$-Si potential barrier near the temperature of the antiferromagnetic–paramagnetic phase transition in chromium are investigated. A significant change in the potential barrier and an anomalous increase in the conductivity in the Cr–$p$-Si–Au structure are observed near the temperature of the second-order antiferromagnetic–paramagnetic phase transition in chromium. It is established that current fluctuations in the structure are enhanced when approaching the phase-transition point. The experimental results are interpreted based on the assumption that the observed change in the electron-transport properties of the Cr–Si interface is due to a shift of the Fermi quasi-level in chromium as a result of the second-order phase transition.

Received: 15.11.2018
Revised: 26.11.2018
Accepted: 26.11.2018

DOI: 10.21883/FTP.2019.04.47439.9021


 English version:
Semiconductors, 2019, 53:4, 439–441

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