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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2019 Volume 53, Issue 2, Pages 211–215 (Mi phts5588)

This article is cited in 1 paper

Semiconductor structures, low-dimensional systems, quantum phenomena

Lateral mode discrimination in edge-emitting lasers with spatially modulated facet reflectance

N. Yu. Gordeeva, A. S. Payusova, I. S. Mukhinbc, A. A. Serina, M. M. Kulaginaa, Yu. A. Gusevaa, Yu. M. Shernyakova, Yu. M. Zadiranova, M. V. Maksimovb

a Ioffe Institute, St. Petersburg
b Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
c St. Petersburg National Research University of Information Technologies, Mechanics and Optics

Abstract: A post-growth technique aimed at spatial modification of facet reflectance of edge-emitting diode lasers has been proposed. It is based on the deposition of an anti-reflection coating and subsequent precise etching with a focused ion beam. The technique allowed suppressing of high-order lateral modes in 10 $\mu$m stripe lasers based on ten layers of InAs/InGaAs quantum dots.

Received: 01.08.2018
Revised: 13.08.2018

DOI: 10.21883/FTP.2019.02.47100.8971


 English version:
Semiconductors, 2019, 53, 200–204

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