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Fizika i Tekhnika Poluprovodnikov, 2018 Volume 52, Issue 11, Pages 1304–1307 (Mi phts5685)

This article is cited in 2 papers

XXII International symposium ''Nanophysics and Nanoelectronics'', Nizhny novgorod, March, 12-15, 2018

Phosphorus-based nanowires grown by molecular-beam epitaxy on silicon

G. E. Cirlinabcd, R. R. Reznikc, Yu. B. Samsonenkoab, A. I. Khrebtovac, K. P. Kotlyara, I. V. Ilkiva, I. P. Sotnikovabd, D. A. Kirilenkod, N. V. Kryzhanovskayaa

a Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
b Institute for Analytical Instrumentation, Russian Academy of Sciences, St. Petersburg
c St. Petersburg National Research University of Information Technologies, Mechanics and Optics
d Ioffe Institute, St. Petersburg

Abstract: Data on the growth and physical properties of nanostructures of the type “InAsP insert embedded in InP nanowire (NW)” grown on Si (111) surfaces by Au-assisted molecular-beam epitaxy are presented. It is found that nearly 100%-coherent NWs can be grown with a widely varying surface density. A relationship between the optical and structural properties of the NWs is revealed. It is shown that the NWs under study are formed of a purely wurtzite phase. The suggested technology opens up new opportunities for the integration of direct-gap III–V materials and silicon.

Keywords: Molecular Beam Epitaxy (MBE), Nanowires (NWs), Wurtzite Phase, Average Arsenic Content, Triple Boundary.

Received: 25.04.2018
Accepted: 07.05.2018

DOI: 10.21883/FTP.2018.11.46588.10


 English version:
Semiconductors, 2018, 52:11, 1416–1419

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