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Fizika i Tekhnika Poluprovodnikov, 2018 Volume 52, Issue 10, Pages 1115–1119 (Mi phts5703)

This article is cited in 3 papers

Spectroscopy, interaction with radiation

Formation of luminescence spectra and emission intensity in the UV and visible spectral regions for $n$-ZnO/$p$-GaN and $n$-ZnO/$p$-ZnO structures when depositing ZnO films by high-frequency magnetron sputtering

M. M. Mezdroginaa, A. Ya. Vinogradova, Yu. V. Kozhanovab

a Ioffe Institute, St. Petersburg
b Peter the Great St. Petersburg Polytechnic University

Abstract: The emission spectra of structures based on ZnO films deposited by high-frequency magnetron sputtering are studied. Clearly pronounced emission lines associated with the recombination of free ($\lambda$ = 363 nm) and bound excitons ($\lambda$ = 377, 390, 410 nm) are observed in the PL (photoluminescence) spectra ($T$ = 300 K) of $n$-ZnO/$p$-GaN:Mg structures, and no substantial emission is observed in the impurity PL region $\lambda$ = 450–600 nm. Only emission lines characteristic of $n$-ZnO ($\lambda$ = 374 nm) are observed in the EL (electroluminescence) spectra of $n$-ZnO/$p$-ZnO structures ($T$ = 300 K).

Keywords: High-frequency Magnetron Sputtering, Substantial Emission, Vapor Crystal Mechanism, MOCVD Technique, Free Exciton Binding Energy.

Received: 12.11.2017
Accepted: 05.02.2018

DOI: 10.21883/FTP.2018.10.46449.8798


 English version:
Semiconductors, 2018, 52:10, 1233–1237

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