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Fizika i Tekhnika Poluprovodnikov, 2018 Volume 52, Issue 9, Pages 1034–1037 (Mi phts5735)

This article is cited in 4 papers

Semiconductor structures, low-dimensional systems, quantum phenomena

On the impact of barrier-layer doping on the photoluminescence efficiency of InGaAlAs/InGaAs/InP strained-layer heterostructures

E. S. Kolodeznyia, A. S. Kurochkina, S. S. Rochasa, A. V. Babicheva, I. I. Novikova, A. G. Gladysheva, L. Ya. Karachinskyb, A. V. Savel'evac, A. Yu. Egorova, D. V. Denisovbd

a St. Petersburg National Research University of Information Technologies, Mechanics and Optics
b Connector Optics LLC, St. Petersburg
c Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
d Saint Petersburg Electrotechnical University "LETI"

Abstract: The photoluminescence of strained InGaAlAs/InGaAs/InP heterostructures with an active region consisting of nine In$_{0.74}$Ga$_{0.26}$As quantum wells and $\delta$-doped In$_{0.53}$Al$_{0.20}$Ga$_{0.27}$As barrier layers grown by molecular beam epitaxy on an InP(100) substrate is investigated. Analysis of the photoluminescence spectra demonstrates that $p$-type doping leads to an increase in the photoluminescence efficiency at low excitation levels in comparison to a heterostructure with undoped barriers, and increasing the level of barrier doping to (1–2) $\times$ 10$^{12}$ cm$^{-2}$ results in the suppression of nonradiative recombination.

Keywords: Doped Barrier Layer, Nonradiative Recombination, Undoped Heterostructures, Integrated Output Intensity, Vertical-cavity Surface-emitting Lasers (VCSEL).

Received: 13.03.2018
Accepted: 19.03.2018

DOI: 10.21883/FTP.2018.09.46152.8865


 English version:
Semiconductors, 2018, 52:9, 1156–1159

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