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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2018 Volume 52, Issue 6, Pages 625–629 (Mi phts5813)

This article is cited in 3 papers

Semiconductor physics

High-sensitivity photodetector based on atomically thin MoS$_{2}$

S. D. Lavrova, A. P. Shestakovaa, E. D. Mishinaa, Yu. R. Efimenkovb, A. S. Sigova

a MIREA — Russian Technological University, Moscow
b Joint-Stock Company "Scientific and Production Enterprise Pulsar", Moscow

Abstract: A design for a high-sensitivity photodetector with a single layer of MoS$_{2}$ transition-metal dichalcogenide used as the basic functional element is proposed and the process of its fabrication is presented step by step. Quality evaluation and the selection of functional MoS$_{2}$ flakes is based on the results of combined optical characterization. The main operating characteristics of the fabricated device are investigated and a photosensitivity of 1.4 mA/W is demonstrated. A difference of this device in comparison with existing analogues is its high photosensitivity at low operating voltages (in the range of $\pm$ 3 V).

Received: 08.06.2017
Accepted: 28.06.2017

DOI: 10.21883/FTP.2018.06.45927.8668


 English version:
Semiconductors, 2018, 52:6, 771–775

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