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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2017 Volume 51, Issue 10, Pages 1325–1340 (Mi phts6014)

This article is cited in 3 papers

Reviews

Tight-binding simulation of silicon and germanium nanocrystals

A. V. Gert, M. O. Nestoklon, A. A. Prokof'ev, I. N. Yassievich

Ioffe Institute, St. Petersburg

Abstract: This review is devoted to the modeling of Si and Ge nanocrystals by means of the tight-binding method. First we give the short outline of the modeling methods and their application for the discription of silicon and germanium nanocrystals. Then, the tight-binding method with extended $s$, $p$, $d$, and $s^*$ basis is explained in details and the results obtained with the use of this method are presented.

Received: 10.04.2017
Accepted: 17.04.2017

DOI: 10.21883/FTP.2017.10.45009.8605


 English version:
Semiconductors, 2017, 51:10, 1274–1289

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