On the morphology of the interlayer surface and micro-Raman spectra of layered films in topological insulators based on bismuth telluride

Resonant micro-Raman spectra and the morphology of the interlayer Van der Waals surface are studied for layered thin films of $n$-Bi$_{2}$Te$_{3}$ and solid solutions based on Bi$_{2}$Te$_{3}$. It is found that the composition, thickness, surface morphology, and the method of obtaining films affect the relative intensity of Raman phonons, which are sensitive to the topological surface states of Dirac fermions.