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Fizika i Tekhnika Poluprovodnikov, 2017 Volume 51, Issue 1, Pages 101–104 (Mi phts6265)

This article is cited in 2 papers

Manufacturing, processing, testing of materials and structures

InGaN/GaN light-emitting diode microwires of submillimeter length

V. V. Lundina, S. N. Rodina, A. V. Sakharova, E. Yu. Lundinaa, S. O. Usovb, Yu. M. Zadiranova, S. I. Troshkova, A. F. Tsatsul'nikovbc

a Ioffe Institute, St. Petersburg
b Submicron Heterostructures for Microelectronics Research and Engineering Center, Russian Academy of Sciences, St. Petersburg
c St. Petersburg National Research University of Information Technologies, Mechanics and Optics

Abstract: Microcrystalline wire-like InGaN/GaN light-emitting diodes designed as core–shell structures 400–600 $\mu$m in length are grown by metal–organic vapor-phase epitaxy on sapphire and silicon substrates. The technology of the titanium-nanolayer-induced ultrafast growth of nanowire and microwire crystals is used. As a current is passed through the microcrystals, an electroluminescence signal is observed in the blue–green spectral region.

Received: 25.04.2016
Accepted: 29.04.2016

DOI: 10.21883/FTP.2017.01.44003.8293


 English version:
Semiconductors, 2017, 51:1, 100–103

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