XX International Symposium ''Nanophysics and Nanoelectronics'', Nizhny Novgorod, March 14-18, 2016
Physical properties of metal–insulator–semiconductor structures based on $n$-GaAs with InAs quantum dots deposited onto the surface of an $n$-GaAs layer
Abstract:
The properties of metal–insulator–semiconductor (MIS) structures based on $n$-GaAs in which silicon oxide and yttria-stabilized zirconia and hafnia are used as the insulator containing InAs quantum dots, which are embedded at the insulator/$n$-GaAs interface, are investigated. The structures manifest the resistive switching and synaptic behavior.