RUS  ENG
Full version
JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 1987 Volume 21, Issue 4, Pages 592–597 (Mi phts641)

Threshold Energy of Point-Defect Formation in Silicon Using Electron-Microscopic Data

L. I. Fedina, A. L. Aseev, S. G. Denisenko, L. S. Smirnov




© Steklov Math. Inst. of RAS, 2024