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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2016 Volume 50, Issue 3, Pages 408–414 (Mi phts6524)

This article is cited in 5 papers

Semiconductor physics

High-voltage silicon-carbide thyristor with an $n$-type blocking base

M. E. Levinshteĭna, T. T. Ėnatsakanovb, S. N. Yurkovb, A. G. Tandoevb, Sei-Hyung Ryuc, J. W. Palmourc

a Ioffe Institute, St. Petersburg
b Russian Electrotechnical Institute Named after V. I. Lenin, Moscow, Russia
c Cree Inc., USA

Abstract: The possibility of creating a high-voltage SiC thyristor with an $n$-type blocking base is analyzed. It is shown that a thyristor structure fabricated as an “analog” of a modern thyristor structure with a $p$-type blocking base, i.e., with the same layer thicknesses and replaced doping types (donors instead of acceptors, and vice versa), cannot be turned-on at any input signal level. At room temperature, a structure with an $n$-type blocking base and acceptable parameters can only be obtained in the absence of a stop layer. In this case, however, the maximum blocking voltage is approximately two times lower than that for a thyristor with a $p$-type blocking base of the same thickness. In the presence of a stop layer, a portion of an $S$-shaped negative differential resistance appears at room temperature in the forward current–voltage characteristic of the thyristor with an $n$-type blocking base. This effect is due to the violation and subsequent restoration of neutrality. At ambient temperatures of $T\ge$ 150$^\circ$C, the current–voltage characteristics of the thyristor with the $n$-type blocking base become quite acceptable even in the presence of a stop layer.

Keywords: Doping Level, Blocking Base, Carrier Lifetime, Voltage Characteristic, Minority Carrier Lifetime.

Received: 14.07.2015
Accepted: 08.09.2015


 English version:
Semiconductors, 2016, 50:3, 404–410

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