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Fizika i Tekhnika Poluprovodnikov, 2016 Volume 50, Issue 3, Pages 415–419 (Mi phts6525)

Manufacturing, processing, testing of materials and structures

Effect of the Ti-nanolayer thickness on the self-lift-off of thick GaN epitaxial layers

A. A. Yugova, S. S. Malakhova, A. A. Donskova, M. P. Duhnovskiib, S. N. Knyazeva, Yu. P. Kozlovac, T. G. Yugovaa, I. A. Belogorohova

a JSC "Giredmet" SRC RF, the Federal State Research and Design Institute of Rare Metal Industry, Moscow, Russia
b Research and Production Corporation "Istok" named after Shokin, Fryazino, Moskovskaya obl.
c Institute for Nuclear Research, Russian Academy of Sciences, Moscow

Abstract: The effect of the type of substrate, sapphire substrate (c- and r-orientation) or GaN/Al$_2$O$_3$ template (c- and r-orientations), on the nitridation of an amorphous titanium nanolayer is shown. The effect of the titanium-nanolayer thickness on thick GaN epitaxial layer self-separation from the substrate is revealed. The titanium-nanolayer thickness at which thick GaN layer is reproducibly self-separated is within 20–40 nm.

Keywords: Sapphire Substrate, Diffraction Reflection Curve, Template Substrate.

Received: 23.06.2015
Accepted: 30.06.2015


 English version:
Semiconductors, 2016, 50:3, 411–414

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