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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2020 Volume 54, Issue 11, Page 1218 (Mi phts6670)

This article is cited in 5 papers

Surface, interfaces, thin films

Growth and characterization of ZnO and Al-doped ZnO thin films by a homemade spray pyrolysis

Y. Larbaha, M. Adnaneb, B. Rahala

a Spectrometry Department, Nuclear Research Center of Algiers-CRNA 02 Bd. Frantz, Fanon BP 399 Algiers Algeria
b Technology Department, University of Science and Technology of Oran. USTO-MB, B.P. 1505, 31000 El-Mnaouer Oran, Algeria

Abstract: In this work, we have prepared the undoped and Al-doped ZnO thin films by a homemade spray pyrolysis method at 450$^\circ$ C onto glass substrates. The XRD patterns of undoped ZnO and aluminized zinc-oxide (AZO) thin films exhibit hexagonal wurtzite crystal structure with high crystalline quality, the crystallite size is nanometric. The morphology of the undoped and Al-doped ZnO thin films also indicate that all samples have a nanoscale grain size around 50 nm, and the microstructure of ZnO films is highly influenced by the aluminum doping. The two films are characterized by UV-visible spectrophotometry showing that the films have a whole optical transmission above 85% in the visible range. The composition of our films is obtained by energy dispersive spectrum, confirmed by Auger electron spectroscopy (AES) and by Rutherford back-scattering spectrometry (RBS) techniques.

Keywords: ZnO, AZO spray, AES, RBS.

Received: 18.01.2020
Revised: 08.07.2020
Accepted: 20.07.2020

Language: English


 English version:
Semiconductors, 2020, 54:11, 1439–1444


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