Electronic structure of janus layers based on Ti$_{1-y}$Cr$_y$(Se$_{1-x}$S$_x$)$_2$

Single crystals Ti$_{0.9}$Cr$_{0.1}$(Se$_{0.8}$S$_{0.2}$)$_2$ and Ti$_{0.85}$Cr$_{0.15}$(Se$_{0.8}$S$_{0.2}$)$_2$ were synthesized for the first time by gas-transport reactions. The structural and phase purity of the obtained single crystals was investigated by X-ray powder diffraction. The chemical composition of the synthesized samples was determined by energy dispersive X-ray spectroscopy on a scanning electron microscope. The electronic structure was studied by ARPES method. With increasing Cr concentration, a decrease in conduction band filling and a decrease in hole mass is observed. The absence of dispersion-free band is also observed, which indicates the absence of metal intercalation into the interlayer space.