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Fizika i Tekhnika Poluprovodnikov, 2024 Volume 58, Issue 12, Pages 709–713 (Mi phts6825)

Semiconductor physics

Metamorphic InGaAs photodiode with wavelength 1.55 $\mu$m, grown on GaAs substrate

I. V. Samartseva, N. V. Baidusa, S. Yu. Zubkova, D. M. Balyasnikova, K. S. Zhidyaeva, A. V. Zdoroveyshcheva, A. I. Bobrova, K. V. Sidorenkoa, A. V. Nezhdanova, D. S. Klement'evb

a National Research Lobachevsky State University of Nizhny Novgorod
b Scientific Research Institute Measuring Systems named J.E. Sedakov, 603952 Nizhny Novgorod, Russia

Abstract: The article presents the results of investigation of photodiodes for 1.55 $\mu$m wavelength, grown on GaAs substrates. InGaAs photodiode structures with InAlGaAs metamorphic buffer layer with quasi-root change of In concentration were grown by Metal Organic Chemical Vapor Deposition (MOCVD) has been developed. Photodiodes created based on the obtained structures had photosensitivity region up to 1.68 $\mu$m. The dark current density at reverse bias of -2 V was 3 $\cdot$ 10$^{-3}$ A/cm$^2$. The photosensitivity at wavelength of 1.55 $\mu$m was 0.6 A/W.

Keywords: MOCVD, nanomaterials, A$^{\mathrm{III}}$B$^{\mathrm{V}}$ semiconductors, infrared photodiodes, dark current.

Received: 15.11.2024
Revised: 21.11.2024
Accepted: 18.12.2024

DOI: 10.61011/FTP.2024.12.59832.7348



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