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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2023 Volume 57, Issue 1, Pages 71–76 (Mi phts6836)

Semiconductor physics

Structure and optical properties of a composite AsSb–Al$_{0.6}$Ga$_{0.4}$As$_{0.97}$Sb$_{0.03}$ metamaterial

L. A. Snigireva, V. I. Ushanova, A. A. Ivanova, N. A. Berta, D. A. Kirilenkoa, M. A. Yagovkinaa, V. V. Preobrazhenskiib, M. A. Putyatob, B. R. Semyaginb, I. A. Kasatkinc, V. V. Chaldysheva

a Ioffe Institute, 194021 St. Petersburg, Russia
b Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, 630090 Novosibirsk, Russia
c Saint Petersburg State University, St. Petersburg, Russia

Abstract: Epitaxial layers of Al$_x$Ga$_{1-x}$As$_{1-y}$Sb$_y$ with an aluminum content $x\sim$ 60% and antimony content $y\sim$3% were successfully grown by molecular-beam epitaxy at low temperature. A developed system of AsSb nanoinclusions was formed in the semiconductor matrix by subsequent annealing. The extended transparency window of the obtained metamaterial allows us to document the absorption of light near the interband absorption edge of the Al$_x$Ga$_{1-x}$As$_{1-y}$Sb$_y$ semiconductor matrix. Parameters of the observed extinction band allow us to attribute the optical absorption to the plasmon resonance in the system of AsSb nanoinclusions.

Keywords: molecular beam epitaxy, x-ray diffraction analysis, transmission electron microscopy, optical properties, plasmon resonance.

Received: 19.01.2023
Revised: 07.02.2023
Accepted: 09.02.2023

DOI: 10.21883/FTP.2023.01.54933.4545



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