K. S. Daliev, A. A. Lebedev, V. Ekke, “Effect of Thermal Treatment on the Density of Radiation-Induced Defects in the Dielectric and on the Semiconductor Surface of Silicon MDS Structures”, Fizika i Tekhnika Poluprovodnikov, 1987, Volume 21, Issue 5,Pages <nobr>836

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Fizika i Tekhnika Poluprovodnikov, 1987 Volume 21, Issue 5, Pages 836–841 (Mi phts695)

Effect of Thermal Treatment on the Density of Radiation-Induced Defects in the Dielectric and on the Semiconductor Surface of Silicon MDS Structures

K. S. Daliev, A. A. Lebedev, V. Ekke

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