Abstract:
The photosensitivity, photoluminescence, and electroluminescence spectra of InGaAs/GaAs diode nanoheterostructures with a Si $\delta$ layer formed at a distance of 10 nm from the InGaAs quantum well are studied. The influence of the arrangement of the $\delta$ layer with respect to the quantum well on the optoelectronic properties of the structures is established.