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Fizika i Tekhnika Poluprovodnikov, 2015 Volume 49, Issue 2, Pages 163–170 (Mi phts7205)

This article is cited in 5 papers

XVIII Symposium "Nanophysics and Nanoelectronics", Nizhni Novgorod, March 10-14, 2014

Molecular beam epitaxy of A$^{\mathrm{III}}$P$_x$As$_{1-x}$ solid solutions: Mechanism of composition formation in the sublattice of a group V element

E. A. Emelyanov, M. A. Putyato, B. R. Semyagin, D. F. Feklin, V. V. Preobrazhenskii

Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk

Abstract: The effect of substrate temperature, As$_2$ and P$_2$ molecular flux densities, and growth rate on the composition of (A$^{\mathrm{III}}$)P$_x$As$_{1-x}$ solid solution layers prepared by molecular beam epitaxy is experimentally investigated. Experimental data in a wide range of growth conditions are analyzed. The results obtained are presented in the form of a kinetic model for describing the process of formation of the composition in the Group V sublattice of the (A$^{\mathrm{III}}$)P$_x$As$_{1-x}$ solid solution upon molecular beam epitaxy. The model can be used for choosing the growth conditions of the (A$^{\mathrm{III}}$)P$_x$As$_{1-x}$ (001) solid-solution layers of a specified composition.

Received: 23.05.2014
Accepted: 16.06.2014


 English version:
Semiconductors, 2015, 49:2, 157–165

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