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Fizika i Tekhnika Poluprovodnikov, 2015 Volume 49, Issue 3, Pages 421–425 (Mi phts7247)

This article is cited in 4 papers

Manufacturing, processing, testing of materials and structures

Formation of Si nanocrystals in multilayered nanoperiodic Al$_2$O$_3$/SiO$_x$/Al$_2$O$_3$/SiO$_x$/$\dots$/Si(100) structures: Synchrotron and photoluminescence data

S. Yu. Turishcheva, V. A. Terekhova, D. A. Koyudaa, D. E. Spirina, E. V. Parinovaa, D. N. Nesterova, D. A. Grachevb, I. A. Karabanovab, A. V. Ershovb, A. I. Mashinb, È. P. Domashevskayaa

a Voronezh State University
b Lobachevsky State University of Nizhny Novgorod

Abstract: The results of X-ray absorption near-edge structure spectroscopy data obtained with synchrotron radiation for multilayered nanoperiodic Al$_2$O$_3$/SiO$_x$/Al$_2$O$_3$/SiO$_x$/$\dots$/Si(100) structures annealed at temperatures of 500–1100$^\circ$C are reported. The data show that, upon high-temperature annealing ($\sim$ 1100$^\circ$C), the structures are modified. The modification is attributed to the formation of Si nanocrystals in deep layers of the structures. At the same time, the structures exhibit size-dependent high-intensity photoluminescence in the photon-energy range 1.4–1.52 eV.

Received: 22.04.2014
Accepted: 12.05.2014


 English version:
Semiconductors, 2015, 49:3, 409–413

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