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Fizika i Tekhnika Poluprovodnikov, 2015 Volume 49, Issue 4, Pages 569–572 (Mi phts7274)

This article is cited in 22 papers

Manufacturing, processing, testing of materials and structures

MBE growth of GaP on a Si substrate

M. S. Sobolev, A. Lazarenko, E. V. Nikitina, E. V. Pirogov, A. S. Gudovskikh, A. Yu. Egorov

St. Petersburg Academic University — Nanotechnology Research and Education Centre of the Russian Academy of Sciences (the Academic University)

Abstract: It is shown that single-crystal GaP buffer layers can be formed on a Si substrate by molecular-beam epitaxy, with the “migration-enhanced epitaxy” procedure applied in the stage in which the nucleating layer is formed. When a GaP layer is produced on a $p$-type silicon substrate, a $p$$n$ junction is created in a natural way between the $p$-Si substrate and the surface $n$-Si layer produced by the diffusion of phosphorus into the substrate during the course of the epitaxial growth of GaP. This $p$$n$ junction can be used as the first junction of a silicon-based multijunction photovoltaic converter.

Received: 22.09.2014
Accepted: 30.09.2014


 English version:
Semiconductors, 2015, 49:4, 559–562

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