E. I. Terukov, P. P. Seregin, A. V. Marchenko, D. V. Zhilina, K. U. Bobokhuzhaev, “X-ray fluorescence analysis of Ge$_{1-x}$Se$_x$, As$_{1-x}$Se$_x$, and Ge$_{1-x-y}$As$_y$Se$_x$ glasses using electronic excitation”, Fizika i Tekhnika Poluprovodnikov, 2015, Volume 49, Issue 10,Pages 1397

This article is cited in 5 papers

Amorphous, glassy, organic semiconductors

X-ray fluorescence analysis of Ge$_{1-x}$Se$_x$, As$_{1-x}$Se$_x$, and Ge$_{1-x-y}$As$_y$Se$_x$ glasses using electronic excitation

E. I. Terukov^a, P. P. Seregin^b, A. V. Marchenko^b, D. V. Zhilina^a, K. U. Bobokhuzhaev^c

^a Ioffe Institute, St. Petersburg
^b Herzen State Pedagogical University of Russia, St. Petersburg
^c National University of Uzbekistan named after M. Ulugbek, Tashkent

Abstract: X-ray fluorescence analysis with fluorescence excitation by an electron beam with an energy of 30 kV is applied to determine the germanium, arsenic, and selenium contents in Ge$_{1-x}$Se$_x$, As$_{1-x}$Se$_x$, and Ge$_{1-x-y}$As$_y$Se$_x$ glassy alloys. Using calibration dependences, the quantitative composition of the glasses is determined with an accuracy of $\pm$ 0.0002 for parameters $x$ and $y$ in a surface layer $\sim$ 0.1 $\mu$m deep.

Received: 19.02.2015
Accepted: 25.02.2015