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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2014 Volume 48, Issue 4, Pages 564–569 (Mi phts7576)

This article is cited in 8 papers

Manufacturing, processing, testing of materials and structures

Effect of low-temperature annealing on the quality of InSe layered single crystals and the characteristics of $n$-InSe/$p$-InSe heterojunctions

V. A. Khandozhkoa, Z. R. Kudrynskyib, Z. D. Kovalyukb

a Chernivtsi National University named after Yuriy Fedkovych
b Frantsevich Institute of Materials Science Problems, National Academy of Sciences of Ukraine, Kiev

Abstract: The effect of the low-temperature annealing of $n$- and $p$-type InSe single crystals on the photoelectric characteristics of $n$-InSe/$p$-InSe heterojunctions is investigated. It is found that the most pronounced enhancement of these characteristics takes place for annealing temperatures of 150–200$^\circ$C. Improvement in the quality of single-crystal samples upon annealing is confirmed by the observation of multiplet nuclear quadrupole resonance spectra, which reflect ordering in the system of polytypes of layered InSe crystals. For annealed materials, $n$-InSe/$p$-InSe structures exhibit an increase in the intensity of the exciton peak and an increase in the open-circuit voltage from 0.29 to 0.56 V and short-circuit current from 350 to 840 $\mu$A/cm$^2$.

Received: 21.03.2013
Accepted: 20.08.2013


 English version:
Semiconductors, 2015, 48:4, 545–550

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