Short Notes

Activation Energy of Thermal Ionization of Radiation-Induced Defects in Dislocation Silicon

L. A. Kazakevich, V. I. Kuznetsov, P. F. Lugakov

A. N. Sevchenko Research Institute of Applied Physical Problems, Belarusian State University, Minsk

UDC: 621.315.592

Received: 03.07.1985
Accepted: 31.08.1985