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JOURNALS // Fizika i Tekhnika Poluprovodnikov // Archive

Fizika i Tekhnika Poluprovodnikov, 2014 Volume 48, Issue 9, Pages 1287–1293 (Mi phts7706)

This article is cited in 2 papers

Manufacturing, processing, testing of materials and structures

High-power AlGaInN LED chips with two-level metallization

D. A. Zakgeimab, G. V. Itkinsonb, M. V. Kukushkinb, L. K. Markovab, O. V. Osipovb, A. S. Pavluchenkoa, I. P. Smirnovaab, A. E. Chernyakovc, D. A. Baumand

a Ioffe Institute, St. Petersburg
b NTL Innovation Center OOO
c Submicron Heterostructures for Microelectronics Research and Engineering Center, Russian Academy of Sciences, St. Petersburg
d Svetlana Optoelectronics ZAO, St. Petersburg

Abstract: A high-power AlGaInN light-emitting flip-chip crystal with a new configuration of contact pads is developed and fabricated. The implementation of a two-level metallization scheme with a dielectric insulating interlayer significantly improves the active-to-total area ratio of the heterostructure (to 78%). Numerical simulation of the current spread, employed when developing the chip topology, makes it possible to achieve high uniformity of the current distribution over the active-region area and to obtain small values of the differential resistance of the chip (0.3 $\Omega$). Light-emitting diodes with the maximum external quantum efficiency (60%) and output optical power (542 mW) at a working pump current of 350 mA are fabricated on the basis of crystals developed in the study.

Received: 27.12.2013
Accepted: 24.01.2014


 English version:
Semiconductors, 2014, 48:9, 1254–1259

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