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Fizika i Tekhnika Poluprovodnikov, 2014 Volume 48, Issue 11, Pages 1562–1563 (Mi phts7756)

Manufacturing, processing, testing of materials and structures

Phase formation upon the interaction of thin films in the system Yb$_{1-x}$Sm$_x$Те–As$_2$Te$_3$

E. Sh. Gadzhiev

Institute of Physics Azerbaijan Academy of Sciences

Abstract: Phase formation upon the interaction of thin Yb$_{1-x}$Sm$_x$Те ($x$ = 0.02) and As$_2$Te$_3$ films obtained through their simultaneous and successive evaporation is studied. It is shown that the Yb$_{1-x}$Sm$_x$As$_4$Te$_7$ phase is formed upon interaction of the thin films at a temperature of 473 K and the Yb$_{1-x}$Sm$_x$As$_2$Te$_4$ phase at 503 K.

Received: 15.05.2013
Accepted: 24.02.2014


 English version:
Semiconductors, 2014, 48:11, 1525–1526

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