Abstract:
Semiconductor samarium monosulfide polycrystals obtained by reaction between samarium trihydride (SmH$_3$) and its sesquisulfide were studied. The temperature, baric and frequency dependences of the resistivity and structural features of the samples were investigated. It is shown that the value of X-ray coherent scattering region is extremely small for SmS samples, 320 $\mathring{\mathrm{A}}$; critical pressure of semiconductor-metal phase transition is higher than in the samples, obtained by other methods, 0.88 GPa; the temperature dependence of the resistivity has metallic behaviour. Hopping mechanism of electron transport was found. All these features are explained by more defective structure of the polycrystalline SmS samples.