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Fizika i Tekhnika Poluprovodnikov, 2025 Volume 59, Issue 6, Pages 370–375 (Mi phts8208)

Semiconductor physics

Characterization of AlGaN/GaN high frequency transistors with field-plate electrode on a silicon substrate

M. N. Zhuravleva, V. E. Zemlyakova, N. V. Guminova, A. A. Zaitseva, D. S. Shpakova, I. V. Makartseva, K. V. Dudinovb, V. I. Egorkina

a National Research University of Electronic Technology
b Research and Production Corporation "Istok" named after Shokin, Fryazino, Moskovskaya obl.

Abstract: The electrical breakdown and microwave characteristics of AlGaN/GaN transistors with different field-plate electrodes, electrically connected to the source via a common bus, were studied. It was shown that adding field-effect electrodes increases the breakdown voltage, increases the gain by more than 2 dB in the frequency range up to 15 GHz.

Received: 17.07.2025
Revised: 27.08.2025
Accepted: 11.09.2025

DOI: 10.61011/FTP.2025.06.61574.8391



© Steklov Math. Inst. of RAS, 2025