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Fizika i Tekhnika Poluprovodnikov, 2012 Volume 46, Issue 8, Pages 1088–1093 (Mi phts8311)

This article is cited in 7 papers

Semiconductor physics

Schottky contacts to high-resistivity epitaxial GaAs layers for detectors of particles and X- or $\gamma$-ray photons

G. I. Koltsova, S. I. Didenkoa, A. V. Chernykha, S. V. Chernykha, A. P. Chubenkob, Yu. N. Sveshnikovc

a National University of Science and Technology «MISIS», Moscow
b P. N. Lebedev Physical Institute, Russian Academy of Sciences, Moscow
c JSC Elma-Malachit, Moscow, Zelenograd

Abstract: The electrical characteristics of Ti and Pt Schottky contacts to epitaxial $n$-GaAs layers with the charge-carrier concentration $<$ 10$^{12}$ cm$^{-3}$ for detectors of particles and X- or $\gamma$-ray photons are studied. It is shown that it is preferable to use a diffusion-based theory of charge transport in calculations of the parameters of Schottky contacts to thick high-resistivity lightly compensated GaAs layers. The calculated barrier heights were 0.84 and 0.87 eV for the Ti and Pt contacts, respectively. The fabricated samples of the surface-barrier detectors featured a linear response in the studied range of energies from 6 to 140 keV for $\gamma$-ray photons and from 4 to 8 MeV for $\alpha$ particles; the efficiency of charge collection was close to 100% and the energy resolution was high at room temperature.

Received: 20.12.2011
Accepted: 30.12.2011


 English version:
Semiconductors, 2012, 46:8, 1066–1071

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