Switch-off relaxation of the parameters of ZnS:Mn thin-film electroluminescent emitters

We have experimentally studied the decay of a current transferred via a phosphor layer in ZnS:Mn thin-film electroluminescent emitters. It is established that this decay is controlled by a bimolecular process of electron trapping on the surface states at the anode phosphor-insulator interface. The rate of the surface trapping, the trapping cross section, and the electron lifetime at the onset of current decay are determined. Dependences of these parameters on the polarity, amplitude, and frequency of the triangular voltage pulses have been studied.