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JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive

Pisma v Zhurnal Tekhnicheskoi Fiziki, 1989 Volume 15, Issue 17, Pages 30–33 (Mi pjtf2852)

ELECTRONIC ANALOGS OF THE TECHNIQUE OF BACK SCATTERING OF FAST IONS FOR INVESTIGATION OF DEFECT DEPTH PROFILES IN MONOCRYSTALS

V. V. Makarov, V. P. Artemev, N. N. Petrov




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