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// Pisma v Zhurnal Tekhnicheskoi Fiziki
// Archive
Pisma v Zhurnal Tekhnicheskoi Fiziki,
1989
Volume 15,
Issue 17,
Pages
30–33
(Mi pjtf2852)
ELECTRONIC ANALOGS OF THE TECHNIQUE OF BACK SCATTERING OF FAST IONS FOR INVESTIGATION OF DEFECT DEPTH PROFILES IN MONOCRYSTALS
V. V. Makarov
, V. P. Artemev
, N. N. Petrov
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Steklov Math. Inst. of RAS
, 2024