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JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive
Pisma v Zhurnal Tekhnicheskoi Fiziki, 1992 Volume 18, Issue 9, Pages 40–42 (Mi pjtf4294)
OXYGEN PRECIPITATION, INTERNAL GETTERING AND RELIABILITY OF SILICON MOS

S. I. Kusakin, S. V. Lebedev, Y. M. Litvinov, N. F. Moiseenko, V. F. Pavlov




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