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// Pisma v Zhurnal Tekhnicheskoi Fiziki
// Archive
Pisma v Zhurnal Tekhnicheskoi Fiziki,
1987
Volume 13,
Issue 7,
Pages
385–388
(Mi pjtf452)
New method for investigation of microheterogeneity of local centers in high-ohmic semiconductor-materials using the REM
A. V. Govorkov
,
È. M. Omel'yanovskii
,
A. Ya. Polyakov
,
V. I. Raihshtein
,
V. A. Fridman
Received:
28.10.1986
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Steklov Math. Inst. of RAS
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