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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2021 Volume 47, Issue 15, Pages 15–18 (Mi pjtf4717)

This article is cited in 6 papers

Peculiarities of epitaxial growth of III – N led heterostructures on SiC/Si substrates

N. A. Cherkashina, A. V. Sakharovb, A. E. Nikolaevbc, V. V. Lundinc, S. O. Usovb, V. M. Ustinovb, A. S. Grashchenkod, S. A. Kukushkind, A. V. Osipove, A. F. Tsatsul'nikovb

a CEMES–CNRS and Université de Toulouse, Toulouse, France
b Submicron Heterostructures for Microelectronics Research and Engineering Center, Russian Academy of Sciences, St. Petersburg
c Ioffe Institute, St. Petersburg
d Institute of Problems of Mechanical Engineering, Russian Academy of Sciences, St. Petersburg
e Saint Petersburg State University

Abstract: Light emitting III – N heterostructures were grown by metalorganic chemical vapor deposition on the SiC/Si (111) templates (substrates) formed by the method of matched substitution of atoms. Investigations of the optical and structural properties of heterostructures were carried out in order to reveal the formation of defects in the structures. It is shown that features of the growth of the (Al, Ga)N buffer layers in such structuresare associated with the presence of pores in the Si substrate under SiC/Si interface. Applying of the optimal design of the buffer layer allows significantly reduce the dislocation density and form active region with high structural quality.

Keywords: gallium nitride, silicone carbide, silicon, III – N heterostructure, gas-phase epitaxy from organometallic compounds.

Received: 12.04.2021
Revised: 29.04.2021
Accepted: 29.04.2021

DOI: 10.21883/PJTF.2021.15.51227.18827


 English version:
Technical Physics Letters, 2021, 47:10, 753–756

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