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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2021 Volume 47, Issue 11, Pages 44–47 (Mi pjtf4777)

The influence of metal masks on matching of the lower electrode and a high-frequency bias generator at reactive ion etching of large substrates

S. D. Poletayevab, A. I. Lyubimovc

a Image Processing Systems Institute of the RAS - Branch of the FSRC "Crystallography and Photonics" RAS, Samara, Russia, Samara
b Samara National Research University
c State Institute of Applied Optics Federal Research and Production Centre, Kazan

Abstract: The influence of metal masks on matching of the lower electrode and a high-frequency bias generator at selective reactive ion mask etching of large substrates in Freon-14 has been investigated both theoretically and experimentally. It is shown for masks with a coating of substrates of more than 30% that the reactive power component increases at distances from the center that are close to the substrate radius. It is established that the specific reactive power is independent of the thickness and type of metal masks. It is shown experimentally that masks with any substrate-coating coefficient of practical importance connected to the lower electrode via a substrate holder improve matching by decreasing the power reflectance.

Keywords: diffractive microrelief, reactive ion etching, impedance, substrate holder, lower electrode.

Received: 25.01.2021
Revised: 12.03.2021
Accepted: 12.03.2021

DOI: 10.21883/PJTF.2021.11.51008.18717


 English version:
Technical Physics Letters, 2021, 47:8, 569–572

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© Steklov Math. Inst. of RAS, 2024