Abstract:
he oxidation of scaffold of porous silicon in air at 300$^\circ$C or an aqueous HNO$_3$ solution (50 vol%) is found to improve pore filling in electrochemical deposition of indium into it. Due to incomplete oxidation of the porous silicon scaffold, the peak in indium concentration shifts away from the surface, deeper into the porous layer. The greatest effect–the highest indium concentration in pores–is observed for porous silicon oxidized in the HNO$_3$ solution.