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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2021 Volume 47, Issue 1, Pages 12–14 (Mi pjtf4892)

This article is cited in 1 paper

A chaotic potential of charged dislocations in group III-nitride heterojunctions

V. B. Bondarenkoa, A. V. Filimonovab, Ravi Kumarc

a Peter the Great St. Petersburg Polytechnic University
b Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg
c Indian Institute of Technology Madras, Chennai, India

Abstract: The structure of the chaotic potential caused by the electrostatic field of charged dislocations in group III-nitride heterojunctions is investigated. Taking into account the spatial dispersion of the dielectric response of a two-dimensional electron gas, the amplitude and scale of the chaotic potential in the junction plane are determined. It is shown that the parameters of the chaotic potential depend on the density of surface states and the concentration of dislocations.

Keywords: chaotic potential, size effect, heterocontact of III-nitrides, two-dimensional electron gas.

Received: 28.08.2020
Revised: 15.09.2020
Accepted: 16.09.2020

DOI: 10.21883/PJTF.2021.01.50450.18532


 English version:
Technical Physics Letters, 2021, 47:1, 8–10

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© Steklov Math. Inst. of RAS, 2024