Abstract:
The main limitation of the use of tip-enhanced Raman scattering (TERS) is due to the lack of reliable scanning probes. We present a simple procedure to manufacture TERS probes with highly reproducible characteristics that are reliable and provide sufficient enhancement. The procedure is based on the modification of conventional cantilevers of scanning probe microscopes by plasma etching, followed by the formation of a TERS enhancing region at the apex by deposition of colloidal nanoparticles by dielectrophoresis.