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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 46, Issue 16, Pages 3–6 (Mi pjtf5013)

This article is cited in 4 papers

Lasing of injection microdisks with InAs/InGaAs/GaAs quantum dots transferred to silicon

A. E. Zhukova, È. I. Moiseeva, A. M. Nadtochiya, A. S. Dragunovaa, N. V. Kryzhanovskayaa, M. M. Kulaginab, A. M. Mozharovc, S. A. Kadinskayac, O. I. Simchukc, F. I. Zubovc, M. V. Maksimovc

a National Research University "Higher School of Economics", St. Petersburg Branch
b Ioffe Institute, St. Petersburg
c Alferov Federal State Budgetary Institution of Higher Education and Science Saint Petersburg National Research Academic University of the Russian Academy of Sciences, St. Petersburg

Abstract: AlGaAs/GaAs microdisk lasers with InAs/InGaAs quantum dots region were transferred onto a silicon wafer using indium bonding. Microlasers have a joint electrical contact put over a residual $n^+$-GaAs substrate, whereas their individual addressing is achieved by placing them $p$-contact down to separate contact pads. No effect of non-native substrate on electrical resistance, threshold current, thermal resistance, and spectral characteristics was revealed. Microdisks lase in continuous-wave mode without external cooling with the threshold current density of 0.7 kA/cm$^2$. Lasing wavelength remains stable ($<$ 0.1 nm/mA) against injection current increment.

Keywords: semiconductor laser, microdisk laser, nanostructures, hybrid integration.

Received: 24.04.2020
Revised: 06.05.2020
Accepted: 06.05.2020

DOI: 10.21883/PJTF.2020.16.49844.18354


 English version:
Technical Physics Letters, 2020, 46:8, 783–786

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