RUS  ENG
Full version
JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive

Pisma v Zhurnal Tekhnicheskoi Fiziki, 2020 Volume 46, Issue 2, Pages 12–14 (Mi pjtf5206)

This article is cited in 6 papers

Hydride vapor-phase epitaxy of a semipolar AlN(10$\bar{1}$2) layer on a nanostructured Si(100) substrate

V. N. Bessolov, M. E. Kompan, E. V. Konenkova, V. N. Panteleev

Ioffe Institute, St. Petersburg

Abstract: We propose a method for the synthesis of hexagonal AlN layer on Si(100) substrate with a $V$-groove nanostructured surface where the angle between the sloped nanoridge surface and Si(100) plane amounts to 47$^\circ$. It is established that metalorganic hydride vapor-phase epitaxy (HVPE) on this substrate leads to the formation of semipolar AlN(10$\bar{1}$2) layers having an X-ray rocking curve with a minimum FWHM value of $\omega_\theta\sim$ 60 arcmin. Raman spectra of this epilayer display additional peaks related to $A_1$(TO) and $E_1$(TO) phonons in contrast to the spectrum of a polar AlN(0001) layer containing an additional $A_1$(LO) peak.

Keywords: semipolar aluminum nitride, hydride vapor-phase epitaxy, Raman spectroscopy.

Received: 07.10.2019
Revised: 07.10.2019
Accepted: 10.10.2019

DOI: 10.21883/PJTF.2020.02.48944.18061


 English version:
Technical Physics Letters, 2020, 46:1, 59–61

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024