E. V. Kalashnikov, V. N. Gurin, S. P. Nikanorov, M. A. Yagovkina, L. I. Derkachenko, “Stress relaxation in CrSi<nobr>$_{2}$</nobr> crystals grown in weightlessness conditions from the melt Zn of the Cr–Si–Zn system”, Pisma v Zhurnal Tekhnicheskoi Fiziki, 2019, Volume 45, Issue 13,Pages <nobr>52

Stress relaxation in CrSi$_{2}$ crystals grown in weightlessness conditions from the melt Zn of the Cr–Si–Zn system

E. V. Kalashnikov, V. N. Gurin, S. P. Nikanorov, M. A. Yagovkina, L. I. Derkachenko

Ioffe Institute, St. Petersburg

Abstract: Experimental data and their analysis on the study of CrSi$_{2}$ microcrystals grown in weightlessness from the melt Zn of Cr–Si–Zn system by mass crystallization and placed in earth conditions are presented. New properties of such crystals are found.

Keywords: crystallization, microgravity, crystal structure, relaxation, excess stress, defects, lattice constants.

Received: 05.03.2019
Revised: 03.04.2019
Accepted: 03.04.2019

DOI: 10.21883/PJTF.2019.13.47960.17765