RUS  ENG
Full version
JOURNALS // Pisma v Zhurnal Tekhnicheskoi Fiziki // Archive

Pisma v Zhurnal Tekhnicheskoi Fiziki, 2019 Volume 45, Issue 2, Pages 14–17 (Mi pjtf5560)

The influence of an amorphous silicon layer on the adsorption properties of a semiconductor structure under photostimulation conditions

S. V. Stetsyuraa, A. V. Kozlowskia, D. M. Mitinb, A. A. Serdobintseva

a Saratov State University
b Ioffe Institute, St. Petersburg

Abstract: The photostimulated adsorption of glucose oxidase (GOx) on the surface of single-crystalline Si wafers with an amorphous silicon ($a$-Si) layer was examined. Estimation of the difference between the surface coverage by GOx molecules deposited under illumination and in the dark showed that this value increased for the structures with $a$-Si layer by a factor of 2.5 in the case of $n$-Si and by a factor of 1.5 in the case of $p$-Si. It is revealed that the $n$-Si/$a$-Si structures can be used for preliminary photostimulation of the GOx adsorption process.

Received: 10.09.2018

DOI: 10.21883/PJTF.2019.02.47215.17520


 English version:
Technical Physics Letters, 2019, 45:1, 12–15

Bibliographic databases:


© Steklov Math. Inst. of RAS, 2024