Study of the effect of oxides and polycrystal layers on the carrier life-span in monocrystal silicon

N. T. Bagraev, A. L. Diikov, L. E. Klyachkin, V. A. Mashkov, V. L. Sukhanov

Ioffe Physico-Technical Institute USSR Academy of Sciences, Leningrad

Received: 19.02.1987
Revised: 20.05.1987

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