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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2017 Volume 43, Issue 19, Pages 43–50 (Mi pjtf6107)

This article is cited in 2 papers

Comparison of flash-memory elements using materials based on graphene

I. V. Antonovaabc, I. A. Kotina, O. M. Orlovd, S. F. Devyatovaa

a Rzhanov Institute of Semiconductor Physics, Siberian Branch of Russian Academy of Sciences, Novosibirsk
b Novosibirsk State University
c Novosibirsk State Technical University
d Molecular Electronics Research Institute, Moscow, Russia

Abstract: Charge capture on flash-memory test structures with floating gates made of graphene (few-layer graphene) and its compounds (graphene oxide and partially fluorinated graphene) is investigated. A comparison of the memory window for different structures has shown the potential of using reduced graphene oxide, graphene with only a few layers, and fluorographene. For the first time, partially fluorinated graphene has been employed as a floating gate in flash-memory structures. Graphene-based materials are promising for 2D printing technologies and flexible electronics.

Received: 27.12.2016

DOI: 10.21883/PJTF.2017.19.45080.16623


 English version:
Technical Physics Letters, 2017, 43:10, 889–892

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© Steklov Math. Inst. of RAS, 2024