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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2017 Volume 43, Issue 15, Pages 34–41 (Mi pjtf6158)

This article is cited in 4 papers

Deposition of stoichiometric Bi$_{2}$Se$_{3}$ film by vacuum-thermal treatment of Se/Bi heterostructure

V. Ya. Kogai, K. G. Mikheev, G. M. Mikheev

Institute of Mechanics, Ural Branch of RAS, Izhevsk

Abstract: The possibility of obtaining a stoichiometric Bi$_{2}$Se$_{3}$ film by vacuum-thermal treatment of a Se/Bi heterostructure is demonstrated for the first time. It was found that a stoichiometric Bi$_{2}$Se$_{3}$ film can be only produced at a certain ratio of the Se and Bi film thicknesses ($d_{\mathrm{Se}}/d_{\mathrm{Bi}}$ = 3.13). X-ray-diffraction analysis and Raman spectroscopy were used to study the phase transformations in a Se(141 nm)/Bi(45 nm) heterostructure upon its thermal treatment in a vacuum. The phase transition temperatures at which various crystalline phases are formed were determined. It is shown that Bi$_{2}$Se$_{3}$ crystallizes in the Se(141 nm)/Bi(45 nm) heterostructure heated to 493 K in conformity with an exponential law, with a characteristic time in which the equilibrium state is attained equal to 20 min.

Received: 02.02.2017

DOI: 10.21883/PJTF.2017.15.44868.16728


 English version:
Technical Physics Letters, 2017, 43:8, 701–704

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