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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2016 Volume 42, Issue 19, Pages 55–61 (Mi pjtf6292)

Photoluminescence at the fundamental absorption edge of single-crystal silicon textured without masking

A. M. Emel'yanova, S. N. Abolmasovb, E. I. Terukovab

a Ioffe Institute, St. Petersburg
b R&D Center TFTE, St.-Petersburg

Abstract: The extraction efficiencies of edge luminescence from single-crystal silicon have been compared for three structures: textured without masking, untextured, and textured with masking by the technology of high-efficiency solar cells. The highest efficiency was obtained for the structure textured without masking. For this structure, the efficiency of power conversion at a wavelength of $\sim$0.66 $\mu$m and power of 75 mW into edge PL power emerging from the semiconductor was $\eta\approx$ 0.8% under the nonradiative recombination conditions described by the exponential photoluminescence (PL) decay time constant of $\sim$0.11 ms. The directivity diagrams of the edge PL were measured for the three structures under study.

Received: 04.03.2016


 English version:
Technical Physics Letters, 2016, 42:10, 1002–1004

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© Steklov Math. Inst. of RAS, 2024