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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2016 Volume 42, Issue 8, Pages 78–85 (Mi pjtf6447)

This article is cited in 1 paper

An electron-impact ionization study of molecular selenium beams

A. N. Zavilopulo, O. B. Shpenik, M. I. Mykyta, A. M. Mylymko

Institute of Electron Physics, National Academy of Sciences of Ukraine, Uzhgorod, Ukraine

Abstract: We describe the method and presents results of a mass-spectrometric investigation of the yield of positive ions formed as a result of the dissociative ionization of a molecular selenium beam by electron impact. Appearance energies of fragment ions have been determined from the ionization efficiency curves. The dynamics of formation of the molecular ions of selenium in a temperature interval of 420–495 K has been studied. The energy dependences of the efficiency of formation of singly charged Så$_{n}^{+}$ ($n$ = 1–3) and doubly charged Se$^{++}$ ions are analyzed.

Keywords: Selenium, Technical Physic Letter, Dissociative Ionization, Chalcogen, Appearance Energy.

Received: 04.08.2015


 English version:
Technical Physics Letters, 2016, 42:4, 427–430

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