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Pisma v Zhurnal Tekhnicheskoi Fiziki, 2024 Volume 50, Issue 20, Pages 16–19 (Mi pjtf6794)

Solar-blind Schottky photodiodes based on AlGaN:Si/AlN, grown by plasma-activated molecular beam epitaxy

A. N. Semenova, D. V. Nechaeva, D. S. Bureninaa, I. P. Smirnovaa, Yu. M. Zadiranova, M. M. Kulaginaa, S. I. Troshkova, N. M. Shmidta, A. I. Lihacheva, V. S. Kalinovskiia, E. V. Kontrosha, K. K. Prudchenkoa, A. V. Nagornyb, E. V. Lutsenkob, V. N. Zhmerika

a Ioffe Institute, St. Petersburg, Russia
b B. I. Stepanov Institute of Physics, National Academy of Sciences of Belarus, Minsk, Belarus

Abstract: The article describes solar-blind Schottky photodiodes based on AlGaN heterostructures grown by plasma-activated molecular beam epitaxy on c-sapphire substrates with various AlN buffer layers. X-ray diffraction analysis and chemical surface etching were used to estimate density of the threading dislocation that affect leakage currents and spectral sensitivity of photodiodes. Optimization of the photodiodes design and the Ti/Al/Ti/Au contact layer made it possible to achieve a photosensitivity of 51 mA/W in the solar-blind range ($\lambda$ = 290 nm) in the photovoltaic mode.

Keywords: plasma-activated molecular beam epitaxy, solar-blind schottky photodiodes, algan, threading dislocations.

Received: 24.04.2024
Revised: 24.06.2024
Accepted: 25.06.2024

DOI: 10.61011/PJTF.2024.20.58931.19972



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